Two test strategies are used to test virtually all IC logic automatic test pattern generation (ATPG) with test pattern compression, and logic built-in self-test (BIST). For many years, there was a passionate debate between some DFT practitioners about which is the best test method ATPG or BIST. ATPG has been dominant for years, and is now used for full-chip test across the electronics industry. More recently, the use of logic BIST has increased with the higher demand to be able to test chips in a system or with limited tester interface, such as for burn-in test, board test, and MCM (multi-chip module).