• Skip to primary navigation
  • Skip to main content
  • Skip to primary sidebar

Engineering White Papers

White Papers, Catalogs, Case Studies and Resources for Engineers and Professionals

White Papers, Tech Notes, Catalogs and Case Studies

Search White Papers

  • 3D Printing
  • Fastening & Joining
  • Fluid Power
  • Electronics / EE
  • Motion Control
  • Networks
  • Software

Overcoming Systematic Yield Limiters with Diagnosis-Driven Yield Analysis

September 22, 2017 By

Diagnosis-driven yield analysis (DDYA) is a technology that uses production test results, volume scan diagnosis, and statistical analysis to find the cause of yield loss in IC chips. It helps with yield ramp of new manufacturing processes, improving yield of mature processes, and meeting test quality standards for automotive ICs. Applying yield analysis based on volume scan diagnosis results that incorporate design layout and failure data, rather than relying on manufacturing process data alone, can reduce the cycle time to root cause of yield loss by 75-90%.

Mentor Logo

Filed Under: Automation, Mentor Graphics

Primary Sidebar

Search White Papers

Categories

3D CAD 3D Printing 3D Systems Actuators Advanced Materials Ametek Analog Devices Inc. Anritsu Automation Bearings BWC Cables Catalogs Electronics / EE Encoders Faro Fastening & Joining Fluid Power Haydon Kerk HP Hydraulics Intel IoT Linear Motion Mechanical Medical Mentor Graphics Motion Control Motors National Instruments New White Papers Pneumatics Rapid Prototyping Renesas ROLLON Sensors Siemens Silicon Labs Solar Stratasys Tektronix Test & Measurement White Papers Wind Power Wireless

Copyright © 2025 · WTWH Media, LLC · Privacy Policy