The amount of electronic content in passenger cars continues to grow rapidly, driven mainly by the integration of various advanced safety features, which will increase further with the move towards fully autonomous vehicles. It is critical that these safety-related devices adhere to the highest possible quality and reliability requirements formalized in the ISO 26262 standard that is being rapidly adopted by automotive manufacturers and suppliers worldwide. This paper describes the advanced test capabilities for testing digital and analog portions of ICs for use in automotive applications.
