Accurate evaluation of device characteristics requires testing by injecting multiple types of jitter on the device under test (DUT). This paper explains types of jitter, guidance on measurements for complex jitter tests and examples of jitter tolerance measurements using Anritsu’s Signal Quality … [Read more...]
Superposition vs. True-Balanced: What’s Required for Your Signal Integrity Application
Signal integrity applications commonly utilize balanced/differential transmission lines that are typically characterized using vector network analyzers (VNAs). This white paper offers guidance to signal integrity designers on the differences between the superposition and true-balanced approaches and … [Read more...]
RF and Microwave Material Measurement Techniques and Applications
Continual demand to accurately measure dielectric and magnetic properties of material is a common need and apparent in our everyday lives. There is a need to quantitatively characterize material properties at RF and microwave frequencies. Learn more about the use of vector network analyzers (VNAs) … [Read more...]
High-Speed PAM Signal Generation and BER Measurements
By implementing Pulse Amplitude Modulation (PAM) transmission technology, next-generation 200 and 400-Gbits/s transmission methods defined by IEEE802.3bs and IEEE802.3cd increase transmission capacity compared to the conventional NRZ method without increasing the symbol rate. In PAM4 signaling, … [Read more...]
Thunderbolt™ 3 and USB Type-C: Testing in the Fast Lane
This article delves into the emerging test and measurement challenges at a time when signaling frequency and data speed continue to rise in both Thunderbolt™ and USB 3.1 interconnect domains. It will also present viable solutions for testing and validating high-speed serial bus designs built around … [Read more...]
New Paper: PAM4 Demands Accurate S-parameters
This paper covers: NRZ and PAM4 Bandwidth Demands at High Data Rates The Importance of Accurate S-parameters Modeling and Simulation of SERDES, Interconnects, and Circuits PAM4 Analysis Requires VNA Measurements … [Read more...]