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Anritsu

What is behind the drive towards Terahertz technology of 6G?

April 22, 2022 By

Discussion of beyond 5G and 6G topics has started in the academic and research communities, and several research projects are now starting to address the future technology requirements. One part of … [Read more...] about What is behind the drive towards Terahertz technology of 6G?

Filed Under: Anritsu, New White Papers, White Papers

PAM4 Gigabit Ethernet Electrical SERDES Analysis, Debug and Compliance Testing

March 17, 2020 By

This paper shows how PAM4 signaling changes SERDES testing at every level. Calibration of interference and jitter tolerance tests take on a new level of complexity with new test parameters SNDR, COM … [Read more...] about PAM4 Gigabit Ethernet Electrical SERDES Analysis, Debug and Compliance Testing

Filed Under: Anritsu, White Papers

Crosstalk Analysis of High Speed Serial Technology with Vector Network Analyzers

March 10, 2020 By

Since its introduction, high speed serial (HSS) technology’s use of differential signaling has mitigated the effects of crosstalk. At data rates below 10 Gb/s, HSS signal integrity was limited by … [Read more...] about Crosstalk Analysis of High Speed Serial Technology with Vector Network Analyzers

Filed Under: Anritsu, White Papers

New VNA Technologies Enable Millimeter-wave Broadband Testing to 220 GHz

February 28, 2020 By

Over the past few years there has been growing interest in developing solutions that harness millimeter-wave (mmWave) frequencies for terrestrial communication, high-frequency device characterization, … [Read more...] about New VNA Technologies Enable Millimeter-wave Broadband Testing to 220 GHz

Filed Under: Anritsu, White Papers

PCIe® 5.0 SerDes Test and Analysis

February 5, 2020 By

Peripheral Component Interconnect Express (PCIe) is the leading interconnect I/O technology for hard drives, solid state drives (SSDs), graphics cards, Wi-Fi and internal Ethernet connections. PCIe … [Read more...] about PCIe® 5.0 SerDes Test and Analysis

Filed Under: Anritsu

Generating Eye Diagrams in VectorStarTM VNAs Including PAM-4

September 20, 2019 By

In this application note, you will learn how the VectorStarTM VNA provides the ability to display all key parameters such as eye diagram, time domain (TDR), and S-parameters on the same channel while … [Read more...] about Generating Eye Diagrams in VectorStarTM VNAs Including PAM-4

Filed Under: Anritsu, White Papers

NB-IoT: Characteristics and Considerations for Design and Verification

August 14, 2019 By

NB-IoT is one of many wireless technologies being utilized in IoT devices for a variety of applications. Standardized and utilizing an existing network infrastructure, it checks all the boxes in terms … [Read more...] about NB-IoT: Characteristics and Considerations for Design and Verification

Filed Under: Anritsu, White Papers

Best Practical Jitter Tolerance Testing with Signal Quality Analyzer MP1900A

December 3, 2018 By

Accurate evaluation of device characteristics requires testing by injecting multiple types of jitter on the device under test (DUT). This paper explains types of jitter, guidance on measurements for … [Read more...] about Best Practical Jitter Tolerance Testing with Signal Quality Analyzer MP1900A

Filed Under: Anritsu, White Papers

Superposition vs. True-Balanced: What’s Required for Your Signal Integrity Application

September 21, 2018 By

Signal integrity applications commonly utilize balanced/differential transmission lines that are typically characterized using vector network analyzers (VNAs). This white paper offers guidance to … [Read more...] about Superposition vs. True-Balanced: What’s Required for Your Signal Integrity Application

Filed Under: Anritsu, White Papers

RF and Microwave Material Measurement Techniques and Applications

April 18, 2018 By

Continual demand to accurately measure dielectric and magnetic properties of material is a common need and apparent in our everyday lives. There is a need to quantitatively characterize material … [Read more...] about RF and Microwave Material Measurement Techniques and Applications

Filed Under: Anritsu, New White Papers, White Papers

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