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Siemens

Embedded Analytics: A Platform Approach

June 23, 2021 By

Burgeoning complexity, both in systems-on-chip (SoCs) and in the embedded systems they enable, poses a challenge for the semiconductor industry. In this paper, we outline the multi-dimensional nature … [Read more...] about Embedded Analytics: A Platform Approach

Filed Under: New White Papers, Siemens, White Papers

Optimizing the integration of DFM and P&R

March 31, 2021 By

Design companies and foundries are constantly modifying their design implementation flows to deliver the best possible solution for their operational needs, and the best possible designs for the … [Read more...] about Optimizing the integration of DFM and P&R

Filed Under: New White Papers, Siemens, White Papers

Systematic Methodology to Solve Reset Challenges in Automotive SoCs

February 23, 2021 By

Modern automotive SoCs typically contain multiple asynchronous reset signals to ensure systematic functional recovery from unexpected situations and faults. This complex reset architecture leads to a … [Read more...] about Systematic Methodology to Solve Reset Challenges in Automotive SoCs

Filed Under: New White Papers, Siemens, White Papers

5G verification is impossible without emulation

February 18, 2021 By

Emulation, combined with a rich assortment of virtualized versions of the many protocols that 5G will require, is the only practical way of ensuring that the first round of silicon built will be the … [Read more...] about 5G verification is impossible without emulation

Filed Under: Electronics / EE, New White Papers, Siemens, White Papers

Tessent LogicBIST with Observation Scan Technology

February 16, 2021 By

Meeting the ISO 26262 requirements for high quality and long-term reliability mans implementing on-chip safety mechanisms with high defect coverage of IC logic. This paper describes Observation Scan … [Read more...] about Tessent LogicBIST with Observation Scan Technology

Filed Under: New White Papers, Siemens, White Papers

Machine Learning at the Edge: Using HLS to Optimize Power and Performance

February 10, 2021 By

Moving machine learning to the edge has critical requirements on power and performance. Using off-the-shelf solutions is not practical. CPUs are too slow, GPUs/TPUs are expensive and consume too much … [Read more...] about Machine Learning at the Edge: Using HLS to Optimize Power and Performance

Filed Under: Electronics / EE, New White Papers, Siemens, White Papers

The keys to generative design

February 9, 2021 By

Increasing automotive design complexity demands a shift away from legacy automotive design flows that heavily rely on manual design work, data exchange, and requirements tracking. The industry demands … [Read more...] about The keys to generative design

Filed Under: New White Papers, Siemens, White Papers

A machine learning approach to CMP modeling

January 25, 2021 By

Most IC manufacturers use CMP modeling to detect potential hotspots as part of their DFM flow. However, building physics-based or compact models for FCVD and eHARP CMP processes has proven … [Read more...] about A machine learning approach to CMP modeling

Filed Under: New White Papers, Siemens, White Papers

Advanced electrical rule checking in IC reliability verification

January 25, 2021 By

Electrical rule checking (ERC) verifies the robustness of a schematic or layout design, ensuring that circuits will operate as designed and intended. ERC violations can result in reduced yield, or … [Read more...] about Advanced electrical rule checking in IC reliability verification

Filed Under: New White Papers, Siemens, White Papers

Reliability Verification for AI and ML Processors

July 29, 2020 By

Artificial intelligence (AI) and machine learning (ML) are seeing growing adoption in a wide range of applications, due primarily to the improvement in algorithms, advancements in hardware design, and … [Read more...] about Reliability Verification for AI and ML Processors

Filed Under: New White Papers, Siemens, White Papers

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